This paper discusses Chromatic Elemental Imaging (CEI) as it relates to identifying the spatial distribution and relative concentrations of elements with high accuracy and resolution for membrane separation and filtration technologies. Discussed are the benefits of the technology and a comparison to Element Mapping (EM), Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Spectroscopy (EDX) all of which only represent limited results when used separately.
This presentation is available to AMTA Members only.
- Jack Mueller
- Avista Technologies, Inc.
- AMTA/AWWA Membrane Technology Conference, San Antonio, TX
- AMTA/AWWA Membrane Technology Conference
- Membrane diagnostic tool, new membrane technology, Chromatic Elemental Imaging